To introduce students with the fundamentals of high-frequency measurements and the latest techniques for accuracy-enhanced microwave measurements. Automated network analyzers and high-speed wafer probes are used in conjunction with state-of-the-art calibration techniques.

Credit: 3 hours or 3/4 unit

Goals:

To have the student able to assemble, program, and utilize sophisticated automated microwave measurement systems, with an appreciation for the capabilities and the limitations of the microwave measurements and of the automated system. Prerequisite: ECE 350.

Topics:

- Descriptive parameters at microwave frequencies

- Measurement instruments and systems

- Computer-controlled instrumentation

- Accuracy enhancement techniques

- Packaging techniques

- High-speed probing and fixturing techniques

Computer Usage:

Error correction for accuracy-enhanced measurement is performed using Agilent-VEE Pro, ADS and RMB on workstations. Data acquisition and network optimization are achieved through the controllers.

Prerequisites by Topic:

- Transmission line theory

- Theory of wave propagation in waveguide

Texts:

S. Wartenburg, RF Measurements of Die and Packages, Artech House

ABET category content as estimated by faculty member who prepared this course description:

Engineering Science: 1 1/2 credits or 50%

Engineering Design: 1 1/2 credits or 50%